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NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心，四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可
NanoAndMore公司新闻
Cantilever: F: 330 kHz C: 42 N/m L: 125 µmApplications: High Quality Factor AFM CantileversNon-Contact / Standard Tapping Mode AFM ProbesDescription: The new PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointPro...
2019-04-11
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Cantilever: F: 285 kHz C: 42 N/m L: 160 µmApplications: Non-Contact / Standard Tapping Mode AFM ProbesDescription: Optimized positioning through maximized tip visibilityNanoWorld Arrow™ NC probes are designed for non-contact or tapping&tr...
2019-04-13
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Cantilever: F: 330 kHz C: 42 N/m L: 125 µmApplications: High Aspect Ratio (HAR) AFM ProbesDescription: NANOSENSORS™ AR10T-NCH AFM tips are designed for non-contact mode or tapping mode AFM. This probe type combines high operation stabilit...
2019-04-16
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Cantilever: F: 285 kHz C: 42 N/m L: 160 µmApplications: Non-Contact / Standard Tapping Mode AFM ProbesDescription: Optimized positioning through maximized tip visibilityNanoWorld Arrow™ NC probes are designed for non-contact or tapping&tr...
2019-04-19
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Cantilever: F: 190 kHz C: 48 N/m L: 225 µmApplications: Plateau AFM TipsDescription: The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-...
2019-04-21
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Cantilever: F: 75 kHz C: 2 N/m L: 225 µmApplications: Force Modulation (FM) AFM ProbesNon-Contact / Soft Tapping Mode AFM ProbesDescription: The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® serie...
2019-04-22
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Cantilever: F: 75 kHz C: 2.8 N/m L: 225 µmApplications: Magnetic AFM ProbesDescription: NanoWorld Pointprobe® MFM probes are designed for magnetic force microscopy. The force constant and the special hard magnetic tip-side coating of the MF...
2019-04-24
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Cantilever: F: 13 kHz C: 0.2 N/m L: 450 µmApplications: Platinum Silicide AFM ProbesConductive AFM ProbesDescription: NANOSENSORS PtSi-CONT are designed for contact mode (repulsive mode) AFM imaging. Furthermore this probe can be used for force...
2019-05-01
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DNA 连接酶催化相邻 5’端之间磷酸二酯键的形成。 PO4 和 3
2019-05-05
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Cantilever: F: 190 kHz C: 48 N/m L: 225 µmApplications: Non-Contact / Standard Tapping Mode AFM ProbesDescription: NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our ...
2019-05-10
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