Cantilever:

F: 13 kHz C: 0.2 N/m L: 450 µm

Applications:

Platinum Silicide AFM ProbesConductive AFM Probes

Description:

NANOSENSORS PtSi-CONT are designed for contact mode (repulsive mode) AFM imaging. Furthermore this probe can be used for force-distance spectroscopy or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due a low force constant. For applications that require a wear resistant and electrically conductive tip we recommend this type. NANOSENSORS PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).This probe offers unique features:

• platinum silicide coating with excellent conductivity and good wear-out behaviour
• chemically inert
• high mechanical Q-factor for high sensitivity

Platinum silicide on both sides of the cantilever.

AFM Tip:

shape: Standard

radius:

AFM Cantilever:

shape: Beam

length: 450 µm (440 - 460 µm)*

width: 50 µm (42.5 - 57.5 µm)*

thickness: 2 µm (1 - 3 µm)*

force constant: 0.2 N/m (0.02 - 0.77 N/m)*

resonance frequency: 13 kHz (6 - 21 kHz)*

* guaranteed range This product features alignment grooves on the back side of the holder chip.

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