Cantilever:

F: 330 kHz C: 42 N/m L: 125 µm

Applications:

High Quality Factor AFM CantileversNon-Contact / Standard Tapping Mode AFM Probes

Description:

The new PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible tip radius as well as a more defined tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminum coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.

NANOSENSORS™ PPP-QNCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode) under UHV-conditions. Due to its high Q-factor and the typical features of the PPP series this AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

The probe offers unique features:

• excellent tip radius of curvature
• highly doped silicon to dissipate static charge
• Al coating on detector side of cantilever
• chemically inert
• excellent mechanical Q-factor under UHV conditions for high sensitivity

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

AFM Tip:

shape: Standard

height: 10 - 15 µm

radius: (

AFM Cantilever:

shape: Beam

length: 125 µm (115 - 135 µm)*

width: 30 µm (22.5 - 37.5 µm)*

thickness: 4 µm (3 - 5 µm)*

force constant: 42 N/m (10 - 130 N/m)*

resonance frequency: 330 kHz (204 - 497 kHz)*

* guaranteed range This product features alignment grooves on the back side of the holder chip.

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