Cantilever:
F: 75 kHz C: 2.8 N/m L: 225 µm
Applications:
Magnetic AFM Probes
Description:
NanoWorld Pointprobe® MFM probes are designed for magnetic force microscopy. The force constant and the special hard magnetic tip-side coating of the MFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping™ and lift mode operation.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Additionally, this probe offers unique features:
- excellent tip radius of curvature
- high magnetic contrast and lateral resolution < 100 nm
- electrically conductive coating
Soft magnetic samples may be influenced by the tip magnetization! Hard Magnetic Coating / Aluminum Reflex CoatingThe hard magnetic coating consists of a 40 nm thick cobalt alloy layer deposited on the tip side of the cantilever which leads to a permanent magnetization of the tip with the direction usually along the tip axis. We recommend magnetizing the tip by means of a strong magnet (e.g. a NdFeB magnet, a few millimeters in size) prior to the measurement.The aluminum reflex coating deposited on the detector side of the cantilever enhances the reflectance of the laser beam and prevents light from interfering within the cantilever.As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.
AFM Tip:
shape: Standard height: 10 - 15 µm radius: AFM Cantilever:
shape: Beam length: 225 µm (220 - 230 µm)* width: 28 µm (22.5 - 32.5 µm)* thickness: 3 µm (2.5 - 3.5 µm)* force constant: 2.8 N/m (1.2 - 5.5 N/m)* resonance frequency: 75 kHz (60 - 90 kHz)* * typical range
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