Cantilever:

F: 285 kHz C: 42 N/m L: 160 µm

Applications:

Non-Contact / Standard Tapping Mode AFM Probes

Description:

Optimized positioning through maximized tip visibilityNanoWorld Arrow™ NC probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.

Additionally, this probe offers an excellent tip radius of curvature.The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Aluminum Reflex CoatingThe aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:

shape: Arrow

height: 10 - 15 µm

radius:

AFM Cantilever:

shape: Beam

length: 160 µm (155 - 165 µm)*

width: 45 µm (40 - 50 µm)*

thickness: 4.6 µm (4.1 - 5.1 µm)*

force constant: 42 N/m (27 - 80 N/m)*

resonance frequency: 285 kHz (240 - 380 kHz)*

* typical range

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