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NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心，四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可
NanoAndMore公司新闻
DNA 连接酶催化相邻 5’端之间磷酸二酯键的形成。 PO4 和 3
2019-02-05
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Cantilever: F: 330 kHz C: 42 N/m L: 125 µmApplications: Non-Contact / Standard Tapping Mode AFM ProbesDescription: The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application...
2019-02-06
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Cantilever: F: 190 kHz C: 48 N/m L: 225 µmApplications: Non-Contact / Standard Tapping Mode AFM ProbesDescription: NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our ...
2019-02-09
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Cantilever: F: 330 kHz C: 42 N/m L: 125 µmApplications: Plateau AFM TipsDescription: The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-...
2019-02-15
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Cantilever: F: 160 kHz C: 7.4 N/m L: 150 µmApplications: Non-Contact / Soft Tapping Mode AFM ProbesDescription: NanoWorld Pointprobe® NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantil...
2019-02-15
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Cantilever: F: 75 kHz C: 2.8 N/m L: 225 µmApplications: Colloidal AFM ProbesSphere AFM TipsDescription: The new sQube® colloidal probe combines the well-known features of the proven NANOSENSORS™ FM series such as high application vers...
2019-02-19
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DNA 连接酶催化相邻 5’端之间磷酸二酯键的形成。 PO4 和 3
2019-02-20
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Cantilever: F: 85 kHz C: 2.8 N/m L: 240 µmApplications: Conductive AFM ProbesDescription: NANOSENSORS AdvancedTEC™ EFM AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very en...
2019-02-23
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Applications: Non-Contact / Soft Tapping Mode AFM ProbesUltra High Frequency , Ultra Short AFM CantileversForce Modulation (FM) AFM ProbesContact Mode AFM ProbesUltra High Frequency AFM ProbesDescription: The 4XC series features four different cantil...
2019-02-27
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Cantilever: F: 75 kHz C: 2.8 N/m L: 240 µmApplications: Conductive AFM ProbesDescription: Silicon based beam deflection cantilever for electrostatic force mode. Rectangular cantilever that is shaped like an arrow. PtIr5 coating on both sides. P...
2019-03-02
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