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NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心，四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可
NanoAndMore公司新闻
Cantilever: F: 330 kHz C: 40 N/m L: 125 µmApplications: Nanoindentation and Lithography AFM ProbesSphere AFM TipsLife Science AFM ProbesDescription: Controlled radius, pre-calibrated cantilever: spherical AFM tip with a radius of 500 nm for hig...
2018-03-26
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Cantilever: F: 75 kHz C: 3 N/m L: 225 µmApplications: Conductive AFM ProbesDescription: Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:scanning capacitance microscopy (SCM)electrostatic...
2018-04-23
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Cantilever: F: 320 kHz C: 42 N/m L: 125 µmApplications: High Aspect Ratio (HAR) AFM ProbesDescription: NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation sta...
2018-05-21
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Applications: Tipless AFM Cantilevers and Cantilever ArraysDescription: NanoWorld Pyrex-Nitrid probes are designed for various imaging applications in contact or dynamic mode. Tipless cantilevers are often used for applications that require functiona...
2018-06-16
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Applications: Tipless AFM Cantilevers and Cantilever ArraysDescription: Probes of the 37/tipless series have three different tipless contact mode cantilevers on one side of the holder chip. They can be used in various applications. Uncoated AFM Ti...
2018-07-07
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Cantilever: F: 130 kHz C: 15 N/m L: 225 µmApplications: Non-Contact / Soft Tapping Mode AFM ProbesDescription: The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application ver...
2018-07-09
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Cantilever: F: 13 kHz C: 0.2 N/m L: 450 µmApplications: Conductive AFM ProbesDescription: Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as scanning capacitance microscopy (SCM).The rotate...
2018-08-07
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Cantilever: F: 25 kHz C: 0.2 N/m L: 225 µmApplications: Contact Mode AFM ProbesDescription: NanoWorld Pointprobe® CONTSC AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with res...
2018-08-26
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Applications: Fluid Tapping AFM ProbesLife Science AFM ProbesConductive AFM ProbesDescription: The 3XC series features three different cantilevers for various measurement modes:500DC - Contact mode cantilever200AC - Standard AC mode cantilever240AC -...
2019-01-01
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Cantilever: F: 13 kHz C: 0.2 N/m L: 450 µmApplications: Contact Mode AFM ProbesDescription: The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compat...
2019-01-01
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