Cantilever:

F: 13 kHz C: 0.2 N/m L: 450 µm

Applications:

Contact Mode AFM Probes

Description:

The new PointProbe^® Plus (PPP) combines the well-known features of the proven PointProbe^® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.NANOSENSORS^™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The PPP-CONTR type is optimized for high sensitivity due to a low force constant.The probe offers unique features:

• excellent tip radius of curvature
• highly doped silicon to dissipate static charge
• Al coating on detector side of cantilever
• high mechanical Q-factor for high sensitivity

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

AFM Tip:

shape: Standard

height: 10 - 15 µm

radius: (

AFM Cantilever:

shape: Beam

length: 450 µm (440 - 460 µm)*

width: 50 µm (42.5 - 57.5 µm)*

thickness: 2 µm (1 - 3 µm)*

force constant: 0.2 N/m (0.02 - 0.77 N/m)*

resonance frequency: 13 kHz (6 - 21 kHz)*

* guaranteed range This product features alignment grooves on the back side of the holder chip.

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