Cantilever:

F: 130 kHz C: 15 N/m L: 225 µm

Applications:

Non-Contact / Soft Tapping Mode AFM Probes

Description:

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIH AFM probes (Seiko Instruments / high force constant).

The probe offers unique features:

• excellent tip radius of curvature
• highly doped silicon to dissipate static charge
• chemically inert
• high mechanical Q-factor for high sensitivity

Uncoated

AFM Tip:

shape: Standard

height: 10 - 15 µm

radius: (

AFM Cantilever:

shape: Beam

length: 225 µm (215 - 235 µm)*

width: 33 µm (25 - 40 µm)*

thickness: 5 µm (4 - 6 µm)*

force constant: 15 N/m (5 - 37 N/m)*

resonance frequency: 130 kHz (96 - 175 kHz)*

* guaranteed range This product features alignment grooves on the back side of the holder chip.

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