Cantilever:

F: 320 kHz C: 42 N/m L: 125 µm

Applications:

High Aspect Ratio (HAR) AFM Probes

Description:

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.

These probes offer unique features:

• length of the high aspect ratio portion of the tip > 1.5 µm
• typical aspect ratio of this portion in the order of 12:1 (when viewed from side as well as along cantilever axis)
• half cone angle of the high aspect ratio portion typically < 2.8°
• excellent tip radius of curvature

Aluminum Reflex CoatingThe aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:

shape: High-Aspect-Ratio

height: 10 - 15 µm

radius:

AFM Cantilever:

shape: Beam

length: 125 µm (120 - 130 µm)*

width: 30 µm (25 - 35 µm)*

thickness: 4 µm (3.5 - 4.5 µm)*

force constant: 42 N/m (21 - 78 N/m)*

resonance frequency: 320 kHz (250 - 390 kHz)*

* typical range This product features alignment grooves on the back side of the holder chip.

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