Cantilever:

F: 25 kHz C: 0.2 N/m L: 225 µm

Applications:

Contact Mode AFM Probes

Description:

NanoWorld Pointprobe® CONTSC AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probes offers an excellent tip radius of curvature.

Uncoated

AFM Tip:

shape: Standard

height: 10 - 15 µm

radius:

AFM Cantilever:

shape: Beam

length: 225 µm (220 - 230 µm)*

width: 48 µm (42.5 - 52.5 µm)*

thickness: 1 µm (0.5 - 1.5 µm)*

force constant: 0.2 N/m (0.02 - 0.7 N/m)*

resonance frequency: 25 kHz (10 - 39 kHz)*

* typical range This product features alignment grooves on the back side of the holder chip.

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