Cantilever:

F: 75 kHz C: 3 N/m L: 225 µm

Applications:

Conductive AFM Probes

Description:

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:

• scanning capacitance microscopy (SCM)
• electrostatic force microscopy (EFM)
• Kelvin probe force microscopy (KFM)

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

• Bruker / Veeco / Digital Instruments
• Keysight / Agilent / Molecular Imaging
• Asylum Research
• Park Systems
• JEOL
• JPK
• etc.

Consistent high quality at a lower price!

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:

shape: Rotated

height: 17 µm (15 - 19 µm)*

setback: 15 µm (10 - 20 µm)*

radius:

half cone angle: 20°-25° front view, 25°-30° from side, 10° at the apex

AFM Cantilever:

shape: Beam

length: 225 µm (215 - 235 µm)*

width: 28 µm (23 - 33 µm)*

thickness: 3 µm (2 - 4 µm)*

force constant: 3 N/m (1 - 7 N/m)*

resonance frequency: 75 kHz (60 - 90 kHz)*

* typical range This product features alignment grooves on the back side of the holder chip.

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