NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心,四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可
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DNA 连接酶催化相邻 5’端之间磷酸二酯键的形成。 PO4 和 3
2019-01-03 阅读量(0)
Cantilever: F: 130 kHz C: 15 N/m L: 225 µmApplications: Supersharp AFM ProbesSupersharp Tapping Mode AFM ProbesDescription: NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact m...
2019-01-05 阅读量(0)
DNA 连接酶催化相邻 5’端之间磷酸二酯键的形成。 PO4 和 3
2019-01-09 阅读量(0)
Cantilever: F: 320 kHz C: 42 N/m L: 125 µmApplications: High Aspect Ratio (HAR) AFM ProbesDescription: NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation sta...
2019-01-10 阅读量(0)
Cantilever: F: 13 kHz C: 0.18 N/m L: 450 µmApplications: Contact Mode AFM ProbesLife Science AFM ProbesDescription: Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scan...
2019-01-11 阅读量(0)
DNA 连接酶催化相邻 5’端之间磷酸二酯键的形成。 PO4 和 3
2019-01-11 阅读量(0)
Cantilever: F: 300 kHz C: 40 N/m L: 125 µmApplications: High Aspect Ratio (HAR) AFM ProbesDescription: ISC= Improved Super ConeMultipurpose tip for simultaneous measurement of roughness and large step height. The tiphas afully rotational symmet...
2019-01-12 阅读量(0)
Cantilever: F: 190 kHz C: 48 N/m L: 225 µmApplications: Premounted AFM ProbesDescription: NANOSENSORS™ SSS-NCLR probes are designed for non-contact mode or tapping mode AFM. They are offered as an alternative to the NANOSENSORS™ hig...
2019-01-13 阅读量(2)
Cantilever: F: 320 kHz C: 42 N/m L: 125 µmApplications: Non-Contact / Standard Tapping Mode AFM ProbesDescription: NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operatio...
2019-01-15 阅读量(0)
Cantilever: F: 210 kHz C: 72 N/m L: 225 µmApplications: Conductive AFM ProbesDiamond AFM ProbesDescription: NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high fr...
2019-01-17 阅读量(0)
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