Cantilever:

F: 130 kHz C: 15 N/m L: 225 µm

Applications:

Supersharp AFM ProbesSupersharp Tapping Mode AFM Probes

Description:

NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode.All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

Additionally, this probe offers an excellent tip radius of curvature.

Uncoated

AFM Tip:

shape: Supersharp

height: 10 - 15 µm

radius: (

half cone angle: < 10° at 200nm from apex

AFM Cantilever:

shape: Beam

length: 225 µm (220 - 230 µm)*

width: 33 µm (27.5 - 37.5 µm)*

thickness: 5 µm (4.5 - 5.5 µm)*

force constant: 15 N/m (9 - 25 N/m)*

resonance frequency: 130 kHz (110 - 150 kHz)*

* typical range This product features alignment grooves on the back side of the holder chip.

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