CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.. 

The so called "Colloidal Probe Technique", where single colloids are attached to AFM cantilevers for force measurements, opens the chance for a better understanding of fundamental interactions in a variety of fields.

Examples are adhesion phenomena, particle-surface-interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.

 The probe offers unique features:

        - sphere material: silicon dioxide (SiO2)
        - excellent sphere diameter:
          A = 2 µm, B = 3.5 µm, C = 6.62 µm, D = 10.2 µm, or E = 15 µm (all +/- 5%)
          Due to different masses the resonance frequency can differ.
          Please choose A, B, C, D, or E  when ordering!
        - highly doped silicon cantilever to dissipate static charge
        - chemically inert
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position when used together with the Alignment chip
          (within +/- 2 µm)
        - compatible with PointProbe® Plus XY-Alignment Series