nanoandmore/CP-NCH-PM/CP-NCH-PM-E-5/Box of 5 AFM Probes

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¥6301.15
货号:CP-NCH-PM-E-5
浏览量:126
品牌:NanoAndMore
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商品描述

Cantilever:

F:330kHz
C:42N/m
L:125µm

Applications:

ColloidalAFMProbes
SphereAFMTips

Description:

ThenewsQube®colloidalprobecombinesthewell-knownfeaturesoftheprovenNANOSENSORS™NCHseriessuchashighapplicationversatilityandcompatibilitywithmostcommercialSPMswithareproducIBLesphererADIusinsteadofasharptip.Theexcellent radiusandtheminimizedvariationofdiameterprovidereproduciblesignals.

PPP-NCHAFMprobesaredesignedfornon-contactmodeortappingmodeAFM(alsoknownas:attractiveordynamicmode). 

Thesocalled"ColloidalProbeTechnique",wheresinglecolloidsareattachedtoAFMcantileversforforcemeasurements,opensthechanceforabetterunderstandingoffundamentalinteractionsinavarietyoffields.

Examplesareadhesionphenomena,particle-surface-interactions,mechanicalproperties,sUSPensions,hydrodynamicsandboundaryslip-tonamejustsomeoutofanincreasingnumberofapplications.

Theprobeoffersuniquefeatures:

       -spherematerial:polymethylmethacrylate(PMMA)
       -excellentspherediameter:
         A=1.5µm,B=3.36µm,C=6.44µm,D=9.57µm,orE=14.59µm(all+/-5%)
         (Duetodifferentmassestheresonancefrequencycandiffer.)
         PleasechooseA,B,C,D,orE whenordering!
       -highlydopedsiliconcantilevertodissipatestaticcharge
       -chemicallyinert
       -highmechanicalQ-factorforhighsensitivity
       -precisealignmentofthecantileverpositionwhenusedtogetherwiththeAlignmentchip
         (within+/-2µm)
       -compatiblewithPointProbe®PlusXY-AlignmentSeries

None

AFMTip:

  • AFMCantilever:

  • Beam
  • 125µm(115-130µm)*
  • 30µm(22.5-37.5µm)*
  • 4µm(3-5µm)*
  • 42N/m(10-130N/m)*
  • 330kHz(204-497kHz)*
  • *typicalrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip. NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心,四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB(Physikalisch Technische Bundesanstalt)密切合作制定的。因此,PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标