nanoandmore/CP-qp-CONT-SiO/CP-qp-CONT-SiO-C-5/Box of 5 AFM Probes

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¥11000.00
货号:CP-qp-CONT-SiO-C-5
浏览量:84
品牌:NanoAndMore
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商品描述

Cantilever:

F:30kHz
C:0.1N/m
L:125µm

Applications:

ColloidalAFMProbes
SphereAFMTips

Description:

ThenewsQube®colloidalprobecombinesthewell-knownfeaturesoftheprovenqp-CONTprobesseriessuchashighapplicationversatilityandcompatibilitywithmostcommercialSPMswithareproducIBLesphererADIusinsteadofasharptip.Theexcellentradiusandtheminimizedvariationofdiameterprovidereproduciblesignals.

qp-CONTAFMprobesaredesignedforcontactmodeAFMimaginginairorforapplicationsinliquidenvironmentswithareducedthermaldrift.TheCONTtypeisalsooptimizedforhighsensitivityduetoalowforceconstant.

Examplesareadhesionphenomena,particle-surface-interactions,mechanicalproperties,sUSPensions,hydrodynamicsandboundaryslip-tonamejustsomeoutofanincreasingnumberofapplications.

Theprobeoffersuniquefeatures:

    -spherematerial: silicondioxide(SiO2)

    -excellentspherediameter:

     A=2µm,B=3.5µmorC=6.62µm(all+/-5%) 

     PleasechooseA,BorCwhenordering!

Achromium/goldlayerofabout60nmispartiallycoatingthecantileveronthedetectorsidenearitsfreeendwherethetipissituated.ThemainadvantagesofthispartialmetalliccoatingareconsiderablylesscantileverbendingandreduceddriftforSPMmeasurementsinliquidenvironments.

AFMTip:

  • AFMCantilever:

  • Beam
  • 125µm(120-130µm)*
  • 35µm(33-37µm)*
  • 750nm(720-780nm)*
  • 0.1N/m(0.08-0.15N/m)*
  • 30kHz(26-34kHz)*
  • *typicalrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip. NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心,四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB(Physikalisch Technische Bundesanstalt)密切合作制定的。因此,PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标