Cantilever:

F:190kHz
C:48N/m
L:225µm

Applications:

HighAspectRatio(HAR)AFMProbes

Description:

NANOSENSORS™AR5-NCLAFMtipsaredesignedfornon-contactortappingmodeAFM.TheNCLprobeisdesignedforSPMsystemsrequiringaminimumcantileverlength>125µmoraresonancefrequencyoflessthan400kHz.Comparedtothehighfrequencynon-contacttypeNCHthemaximumscanningspeedisslightlyreduced.ThiscantilevertypecombineshighoperationstABIlitywithoutstandingsensitivityandfastscanningability.

Formeasurementsonsampleswithsidewallanglesapproaching90°NANOSENSORS™producesspeciallytailoredtips.ThesetipsareFIB(ForcedIonBeam)milledtoachieveahighaspectratioportionbetterthan5:1attheendofthecommonsilicontip.Thissubtractivemethodofproducingthehighaspectrationeedleofferstheadvantageofhighlateralstiffnessandrigidityofthetip.

Theprobeoffersuniquefeatures:

• lengthofthehighaspectratioportionofthetip>2µm
• typicalaspectratioat2µmintheorderof7:1(whenviewedfromsideaswellasalongcantileveraxis)
• excellenttiprADIusofcurvature
• monolithictip
• highlydopedsilicontodissipatestaticcharge
• highmechanicalQ-factorforhighsensitivity
• precisealignmentofthecantileverposition(within+/-2µm)whenusedwiththeAlignmentChip
• compatIBLewithPointProbe^®PlusXY-AlignmentSeries

*guaranteedrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip. NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心，四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB（Physikalisch Technische Bundesanstalt）密切合作制定的。因此，PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标