Cantilever:
F:75kHzC:2.8N/m
L:225µm
Applications:
MagneticAFMProbesDescription:
TheNANOSENSORS™PPP-MFMRAFMprobeisourstandardprobeformagneticforcemicroscopyprovidingareasonablesensitivity,resolutionandcoercitivity.Ithasprovenstableimagingofavarietyofrecordingmediaandothersamples.Theforceconstantofthisprobetypeisspeciallytailoredformagneticforcemicroscopyyieldinghighforcesensitivitywhilesimultaneouslyenablingtappingmodeandliftmodeoperation.TheSPMprobeoffersuniquefeatures:
- hardmagneticcoatingonthetipside(coercivityofapp.300Oe,remanencemagnetizationofapp.300emu/cm3)
- effectivemagneticmomentintheorderof10^-13emu
- metallicelectricalconductivity
- excellenttiprADIusofcurvature
- magneticresolutionbetterthan50nm
- Alcoatingondetectorsideofcantileverenhancingthereflectivityofthelaserbeambyafactorofabout2.5
- precisealignmentofthecantileverposition(within+/-2µm)whenusedwiththeAlignmentChip
- compatIBLewithPointProbe®PlusXY-AlignmentSeries
Asbothcoatingsarealmoststressfreethebendingofthecantileverduetostressislessthan3.5%ofthecantileverlength.Forenhancedsignalstrengththemagnetizationofthetipbymeansofastrongpermanentmagnetpriortothemeasurementisrecommended.