nanoandmore/SCM-PIC/SCM-PIC-W/Box of 385 AFM Probes

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¥125354.74
货号:SCM-PIC-W
浏览量:124
品牌:NanoAndMore
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商品描述

Cantilever:

F:13kHz
C:0.2N/m
L:450µm

Applications:

ConductiveAFMProbes

Description:

NanoWorldPointprobe®CONTprobesaredesignedforcontactmodeimaging.FurThermorethisprobecanbeusedforforce-distancespectroscopymodeorpulsedforcemode(PFM).TheCONTtypeisoptimisedforhighsensitivityduetoalowforceconstant.

AllSPMandAFMprobesofthePointprobe®seriesaremadefrommonolithicsiliconwhichishighlydopedtodissipatestaticcharge.TheyarechemicallyinertandofferahighmechanicalQ-factorforhighsensitivity.Thetipisshapedlikeapolygonbasedpyramid.

ThisprobewassoldbyVeecoInstrumentsInc.forover10yearsupuntilApril2007.BrukerCorporation,whichacquiredVeecometrologybusiness,isnolongersellingtheoriginalprobewhichhasalwaysbeenmanufacturedbyNanoWorld®.
PtIr5Coating

ThePtIr5coatingconsistsofa23nmthickplatinumiridium5layerdepositedonbothsidesofthecantilever.Thetipsidecoatingenhancestheconductivityofthetipandallowselectricalcontacts.Thedetectorsidecoatingenhancesthereflectanceofthelaserbeambyafactorof2andpreventslightfrominterferingwithinthecantilever.

Thecoatingprocessisoptimizedforstresscompensationandwearresistance.Wearatthetipcanoccurifoperatingincontact-,friction-orforcemodulationmode.Asthecoatingisalmoststress-freethebendingofthecantileverduetostressislessthan2degrees.

AFMTip:

  • AFMCantilever:

  • Beam
  • 450µm(445-455µm)*
  • 50µm(45-55µm)*
  • 2µm(1.5-2.5µm)*
  • 0.2N/m(0.07-0.4N/m)*
  • 13kHz(9-17kHz)*
  • *typicalrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip. NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心,四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB(Physikalisch Technische Bundesanstalt)密切合作制定的。因此,PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标