nanoandmore/CONTPt/CONTPt-10/Box of 10 AFM Probes

价格
¥6173.86
货号:CONTPt-10
浏览量:127
品牌:NanoAndMore
服务
全国联保
正品保证
正规发票
签订合同
商品描述

Cantilever:

F: 13 kHz
C: 0.2 N/m
L: 450 µm

Applications:

Conductive AFM Probes

Description:

NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this AFM tip offers an excellent tip radius of curvature.
PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 450 µm (445 - 455 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm (1.5 - 2.5 µm)*
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip. NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心,四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB(Physikalisch Technische Bundesanstalt)密切合作制定的。因此,PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标