The new PointProbe®Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.
NANOSENSORS™ PPP-CONTPt AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The PPP-CONTPt type is optimized for high sensitivity due to a low force constant.
The probe offers unique features:
metallic conductivity of the tip
high mechanical Q-factor for high sensitivity
The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation and wear resistance. The bending of the cantilever due to stress is less than 3.5% of the cantilever length.
AFM Tip:
AFM Cantilever:
Beam
450 µm (440 - 460 µm)*
50 µm (42.5 - 57.5 µm)*
2 µm (1 - 3 µm)*
0.2 N/m (0.02 - 0.77 N/m)*
13 kHz (6 - 21 kHz)*
* guaranteed range This product features alignment grooves on the back side of the holder chip.
NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心,四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB(Physikalisch Technische Bundesanstalt)密切合作制定的。因此,PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标