nanoandmore/XNC12/Cr-Au/XNC12/Cr-Au-35/Box of 35 AFM Probes

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¥17400.00
货号:XNC12/Cr-Au-35
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品牌:NanoAndMore
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商品描述

Applications:

Silicon Nitride AFM Probes
Life Science AFM Probes

Description:

Probes of the 12 series have 2 silicon nitride cantilevers and tips on each side of the glass holder chip. They are used for soft contact mode applications.

Probes with a conductive, chemically inert 35 nm Cr-Au coating on the tip side of the cantilever and 70 nm Cr-Au coating on the back side of the cantilever. Resulting tip radius is about 30 nm. The coating may cause cantilever bending within 2°.

Cr-Au coating is formed as an Au film on a Cr sublayer, which is deposited for better adhesion of Au. The coating thickness is 70 nm on the backside of the cantilever and 35 nm on the tipside of the cantilever.

AFM Tip:

  • Pyramid
  • 3.5 µm
  • < 30="" nm="">
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Triangle
  • 200 µm (190 - 210 µm)*
  • 28 µm (23 - 33 µm)*
  • 500 nm
  • 0.08 N/m
  • 17 kHz
  • Cantilever B
  • Triangle
  • 100 µm (90 - 110 µm)*
  • 13.5 µm (8.5 - 18.5 µm)*
  • 500 nm
  • 0.32 N/m
  • 67 kHz
  • * typical range NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心,四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB(Physikalisch Technische Bundesanstalt)密切合作制定的。因此,PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标