Silicon Nitride AFM Probes Life Science AFM Probes
Description:
Probes of the 12 series have 2 silicon nitride cantilevers and tips on each side of the glass holder chip. They are used for soft contact mode applications.
Probes with a conductive, chemically inert 35 nm Cr-Au coating on the tip side of the cantilever and 70 nm Cr-Au coating on the back side of the cantilever. Resulting tip radius is about 30 nm. The coating may cause cantilever bending within 2°.
Cr-Au coating is formed as an Au film on a Cr sublayer, which is deposited for better adhesion of Au. The coating thickness is 70 nm on the backside of the cantilever and 35 nm on the tipside of the cantilever.