nanoandmore/DT-NCHR/DT-NCHR-50/Box of 50 AFM Probes

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¥64157.18
货号:DT-NCHR-50
浏览量:115
品牌:NanoAndMore
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商品描述

Cantilever:

F:400kHz
C:80N/m
L:125µm

Applications:

Hardened/EnhancedWearResistanceAFMProbes
NanoindentationandLithographyAFMProbes
DiamondAFMProbes
Hardened/EnhancedWearResistanceTappingAFMProbes

Description:

NANOSENSORS™DT-NCHRprobesaredesignedfornon-contactmodeortappingmodeAFM(alsoknownas:attractiveordynamicmode).ThisprobetypecombineshighoperationstABIlitywithoutstandingsensitivityandfastscanningability.

ForapplicationsthatrequirehardcontactbetweentipandsamplethisSPMprobeoffersarealdiamondtip-sidecoating.Thiscoatingfeaturesextremelyhighwearresistanceduetotheunsurpassedhardnessofdiamond.ThetypicalmacroscopictiprADIusofcurvatureliesisbetween100and200nm.Nanoroughnessesinthe10nmregimeimprovetheresolutiononflatsurfaces.

Theprobeoffersuniquefeatures:

  • realdiamondcoating
  • highmechanicalQ-factorforhighsensitivity
TheDTDiamondCoatingisanapproximately100nmthickcoatingofpolycrystallinediamondonthetip-sideofthecantileverleadingtoanunsurpassedhardnessofthetip.Theramanspectrumofthecoatingverifiestherealdiamond.

AFMTip:

  • AFMCantilever:

  • Beam
  • 125µm(115-135µm)*
  • 30µm(22.5-37.5µm)*
  • 4µm(3-5µm)*
  • 80N/m(23-225N/m)*
  • 400kHz(225-610kHz)*
  • *guaranteedrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip. NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心,四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB(Physikalisch Technische Bundesanstalt)密切合作制定的。因此,PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标