nanoandmore/SSS-SEIH/SSS-SEIH-20/Box of 20 AFM Probes

价格
¥18601.13
货号:SSS-SEIH-20
浏览量:68
品牌:NanoAndMore
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商品描述

Cantilever:

F:130kHz
C:15N/m
L:225µm

Applications:

SupersharpAFMProbes
SupersharpTappingModeAFMProbes

Description:

ForownersofaSeikoInstrumentsmicroscopeusingthenon-contactmodewerecommendtheNANOSENSORS™SEIHtype(SeikoInstruments/highforceconstant).ComparedwiththeZEIHtypetheforceconstantisfurtherreduced.

ForenhancedresolutionofnanostructuresandmicroroughnessweofferourSuperSharpSilicon™tipwithunrivalledsharpness.

Theprobeoffersuniquefeatures:

  • excellenttiprADIusofcurvature
  • typicalaspectratioat200nmfromtipapexintheorderof3:1
  • monolithicmaterial
  • highlydopedsilicontodissipatestaticcharge
  • chemicallyinert
  • highmechanicalQ-factorforhighsensitivity
  • precisealignmentofthecantileverposition(within+/-2µm)whenusedwiththeAlignmentChip
  • compatIBLewithPointProbe®PlusXY-AlignmentSeries
Uncoated

AFMTip:

  • AFMCantilever:

  • Beam
  • 225µm(215-235µm)*
  • 33µm(30-45µm)*
  • 5µm(4-6µm)*
  • 15N/m(5-37N/m)*
  • 130kHz(96-175kHz)*
  • *guaranteedrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip. NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心,四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB(Physikalisch Technische Bundesanstalt)密切合作制定的。因此,PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标