Cantilever:
F:130kHzC:15N/m
L:225µm
Applications:
SupersharpAFMProbesSupersharpTappingModeAFMProbes
Description:
ForownersofaSeikoInstrumentsmicroscopeusingthenon-contactmodewerecommendtheNANOSENSORS™SEIHtype(SeikoInstruments/highforceconstant).ComparedwiththeZEIHtypetheforceconstantisfurtherreduced.ForenhancedresolutionofnanostructuresandmicroroughnessweofferourSuperSharpSilicon™tipwithunrivalledsharpness.
Theprobeoffersuniquefeatures:
- excellenttiprADIusofcurvature
- typicalaspectratioat200nmfromtipapexintheorderof3:1
- monolithicmaterial
- highlydopedsilicontodissipatestaticcharge
- chemicallyinert
- highmechanicalQ-factorforhighsensitivity
- precisealignmentofthecantileverposition(within+/-2µm)whenusedwiththeAlignmentChip
- compatIBLewithPointProbe®PlusXY-AlignmentSeries