Cantilever:
F:75kHz
C:2.8N/m
L:225µm
Applications:
ForceModulation(FM)AFMProbes
Non-Contact/SoftTappingModeAFMProbes
Description:
NanoWorldPointProbe®FMprobesaredesignedforforcemodulationmodeimaging.TheforceconstantoftheFMtypefillsthegapbetweencontactandnon-contactprobes.FurThermorenon-contactortapping™modeimagingispossIBLewiththisAFMprobe.
AllprobesofthePointProbe®seriesaremadefrommonolithicsiliconwhichishighlydopedtodissipatestaticcharge.TheyarechemicallyinertandofferahighmechanicalQ-factorforhighsensitivity.Thetipisshapedlikeapolygonbasedpyramid.
Additionally,thisprobeoffersanexcellenttiprADIusofcurvature.
Uncoated
AFMTip:
AFMCantilever:
Beam225µm(220-230µm)*28µm(22.5-32.5µm)*3µm(2.5-3.5µm)*2.8N/m(1.2-5.5N/m)*75kHz(60-90kHz)* *typicalrange NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心,四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB(Physikalisch Technische Bundesanstalt)密切合作制定的。因此,PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标