Cantilever:
F:320kHzC:42N/m
L:125µm
Applications:
Non-Contact/StandardTappingModeAFMProbesDescription:
NanoWorldPointprobe®NCHprobesaredesignedfornon-contactortapping™ modeimaging.ThisprobetypecombineshighoperationstABIlitywithoutstandingsensitivityandfastscanningability.
AllSPMandAFMprobesofthePointprobe®seriesaremadefrommonolithicsiliconwhichishighlydopedtodissipatestaticcharge.TheyarechemicallyinertandofferahighmechanicalQ-factorforhighsensitivity.Thetipisshapedlikeapolygonbasedpyramid.
Additionally,thisprobeoffersanexcellenttiprADIusofcurvature.
Thealuminumreflexcoatingconsistsofa30nmthickaluminumlayerdepositedonthedetectorsideofthecantileverwhichenhancesthereflectanceofthelaserbeambyafactorof2.5.FurThermoreitpreventslightfrominterferingwithinthecantilever.