Blunt or broken tips falsify measurement results like surface roughness or structures dimensions dramatically! To ensure correct results, used tips must be thrown away or checked by SEM regularly, both methods being extremely uneconomic or time consuming.
The solution:TheTipCheckis an SPM sample for fast and convenient determination of the AFM tip condition. Itoffers a fast and easy way to compare and categorize different AFM probes with respect to tip apex shape and sharpness.
Check whether your tip is still good, starts showing wear or already blunted without the need of scanning an entire image or doing an SEM inspection!
Additionally, this sample works perfectly with Auto Tip Qualification and Tip Characterization software that is available on the market.
The three figures show a comparison between different probe tips used to image the TipCheck sample.
The TipCheck sample consists of an extremely wear-resistant thin film coating that is deposited on a silicon chip. This thin film coating shows a granular, sharply peaked nanostructure which makes it ideal for reversely imaging an AFM probe’s tip apex.
The die size of the TipCheck is 5x5mm. It is available either mounted onto a 12mm metal disc or unmounted (TipCheck-UM).
NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心，四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB（Physikalisch Technische Bundesanstalt）密切合作制定的。因此，PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标
