品牌分类
品牌咨询
联系方式
公司地址
苏州工业园区生物纳米园A4#216
联系电话
4000-520-616 / 18915418616
传真号码
0512-67156496
电子邮箱
info@ebiomall.com
公司网址
https://www.ebiomall.com
商品描述
150-2DCalibration Specimen, 2-dimensional, 144 nm nominal period, Al on SiProduct Description150-2D Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on SiSubstrate: Silicon about 4x3 mmDefault mounting: on 12 or 15 mm diam. steel disk NanoAndMore 横向-(xy)-校准标准 (2D200)200 nm 间距精确横向校准的标准产品描述标准(2D200)用于对 AFM 扫描机制进行非常精确的 xy 校准。该标准由蚀刻到硅芯片中的具有 200nm 间距的倒置方形金字塔的二维晶格组成。有源区位于芯片的中心，四周是 FindMe 结构。倒金字塔的格子构成了活动区域。硅芯片粘在直径为 12 毫米的不锈钢样品架上。该支架可以磁性或机械固定。该产品将通过 Gel-Pak® 载体运输。本标准是与德国国家标准权威机构 PTB（Physikalisch Technische Bundesanstalt）密切合作制定的。因此，PTB 能够根据国际准则认证该标准。请直接通过www.ptb.de联系工作组 5.25 Scanning Probe Metrology 。Gel-Pak® 是 Delphon Industries 的注册商标
Available as a traceable calibration specimen (150-2DUTC)Available unmounted on request. Available mounted on SEM stub (150-2D-SEM)
Default mounting: on pin stub type A using colloidal graphite paint.
Colloidal silver paint or adhesive carbon tab available on request.
Carbon tab not recommended for pitch < 500 nm.
See mount descriptions.Re-Calibration traceable to National Laboratory available for $4910.Recertificationpolicy: we do not clean the specimens. If our inspection shows that thespecimen is not in good enough condition for recertification, we willoffer you a new specimen at 80% of the original price.
