Applications:
Contact Mode AFM Probes
Description:
Probes of the 38 series have three different contact mode cantilevers on one side of the holder chip. They can be used in various applications. Uncoated
AFM Tip:
shape: Rotated height: 15 µm (12 - 18 µm)* radius: full cone angle: 40° AFM Cantilevers:
Cantilever A shape: Beam length: 250 µm width: 32.5 µm thickness: 1 µm force constant: 0.09 N/m (0.01 - 0.36 N/m)* resonance frequency: 20 kHz (8 - 32 kHz)* Cantilever B shape: Beam length: 350 µm width: 32.5 µm thickness: 1 µm force constant: 0.03 N/m (0.003 - 0.13 N/m)* resonance frequency: 10 kHz (5 - 17 kHz)* Cantilever C shape: Beam length: 300 µm width: 32.5 µm thickness: 1 µm force constant: 0.05 N/m (0.005 - 0.21 N/m)* resonance frequency: 14 kHz (6 - 23 kHz)* * typical range
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