Cantilever:

F: 25 kHz C: 0.2 N/m L: 225 µm

Applications:

Contact Mode AFM ProbesLateral Force Mode AFM Probes (LFM)

Description:

The new PointProbe^®Plus (PPP) combines the well-known features of the proven PointProbe^® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.The NANOSENSORS^™ PPP-CONTSC is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.The probe offers unique features:

• excellent tip radius of curvature
• highly doped silicon to dissipate static charge
• high mechanical Q-factor for high sensitivity
• precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe^® Plus XY-Alignment Series

Uncoated

AFM Tip:

shape: Standard

height: 10 - 15 µm

radius: (

AFM Cantilever:

shape: Beam

length: 225 µm (215 - 235 µm)*

width: 48 µm (40 - 55 µm)*

thickness: 1 µm (0.1 - 2 µm)*

force constant: 0.2 N/m (0.01 - 1.87 N/m)*

resonance frequency: 25 kHz (1 - 57 kHz)*

* guaranteed range This product features alignment grooves on the back side of the holder chip.

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