Cantilever:

F: 75 kHz C: 2.8 N/m L: 225 µm

Applications:

Force Modulation (FM) AFM ProbesNon-Contact / Soft Tapping Mode AFM Probes

Description:

NanoWorld PointProbe^® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.Additionally, this probe offers an excellent tip radius of curvature.

Aluminum Reflex CoatingThe aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

AFM Tip:

shape: Standard

height: 10 - 15 µm

radius: (

AFM Cantilever:

shape: Beam

length: 225 µm (220 - 230 µm)*

width: 28 µm (22.5 - 32.5 µm)*

thickness: 3 µm (2.5 - 3.5 µm)*

force constant: 2.8 N/m (1.2 - 5.5 N/m)*

resonance frequency: 75 kHz (60 - 90 kHz)*

* typical range This product features alignment grooves on the back side of the holder chip.

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