TheLeicaEMTXPisatargetpreparationdeviceformilling,sawing,grinding,andpolishingsamplespriortoexaminationbySEM,TEM,andLMtechniques.
AnintegratedstereomicroscopeallowspinpointingandeasypreparationofbarelyvisIBLetargets.
Withthespecimenpivotarmthesamplecanbeobserveddirectlyatananglebetween0°and60°,or90°tothefrontfacefordistancedeterminationwithaneyepiecegraticule.
Integratedautomaticprocesscontrol
IntegratedprocesscontrolwithautomaticE-Wguidingmechanism,force-regulatedfeedcontrolandcountdownfunctionsavestheuserfromtime-consumingroutinesamplepreparation.
Surfacefinishandtargetexamination
Surfacefinishandtargetexaminationwiththeintegratedstereomicroscopemeansthattheuserdoesnothavetotransferthesamplefordistanceestimationandsurfaceevaluation,whichincreasesuserefficiency.
Varietyoftoolinserts
Varietyoftoolinsertsallowsthespecimentobemilled,sawed,drilled,groundandpolishedwithoutsampleremovalfromtheinstrument.TheABIlitytoobservetheprocessthroughthestereomicroscoperesultsintimeandcostsavings.
InspectionofMultilayerSamples
WorkflowinQualityControl:CombiningthetargetsurfacingsystemLeicaEMTXPandthelightmicroscopeLeicaDM2700Mallowstoreducetherequiredprocedure,streamlinetheworkflowandproducereliableandpreciseresults.
