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Ossila/Four-Point Probe, Low Price Resistance Measuring System/AU/T2001A3-AU

价格
¥36000.00
货号:T2001A3-AU
浏览量:127
品牌:Ossila
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商品描述

Quick & accurate characterisation for a wide range of materials.

Experience effortless sheet resistance measurements with the system's easy-to-use PC software.


Part of the Institute of Physics award-winning Ossila Solar Cell Prototyping Platform, Ossila's Four-Point Probe System is an easy-to-use tool for the rapid measurement of sheet resistance, resistivity, and conductivity of materials.

Using our own source measure unit, we have been able to create a low-cost system that allows a wide measurement range. The probe head uses spring-loaded contacts instead of sharp needles, preventing damage to delicate samples, such as polymer films with thicknesses on the order of nanometres.

The system includes a four-point probe, source measure unit, and easy-to-use PC software - enabling more laboratories to measure sheet resistance for the affordable price of £1800.00. It is also covered by ourFREE 2-year warranty .

Four-point probe being held


Features

Wide Current Range - The four-point probe is capable of delivering currents between 10 nA and 150 mA, and can measure voltages from as low as 100 μV up to 10 V. This results in a sheet resistance measurement range of 3 mΩ/□ to 10 MΩ/□, enabling the characterisation of a wide range of materials.

Easy-to-Use - Just plug in the system, install the software, and you're ready to go! The intuitive interface and clean design makes the four-point probe easy-to-use, simplifying the measurement of sheet resistance. Substrates of various shapes and sizes can be used.

High Accuracy - Positive and negative polarity measurements can be performed using the PC software. This enables you to calculate the average sheet resistance between positive and negative currents - eliminating any voltage offsets that may have occurred, hence increasing the accuracy of your measurements.

Non-Destructive Testing - Designed with the measurement of delicate samples in mind, the four-point probe head utilises gold-plated, gentle spring-loaded contacts with rounded tips. This results in a constant contact force of 60 grams, preventing the probes from piercing fragile thin films, whilst still providing good electrical contact.

Space-Saving Design - Through careful design consideration, we have been able to keep the footprint of the four-point probe to a minimum (total bench area of 14.5 cm x 24 cm), allowing it to be used even in busy labs where shelf space is lacking.

Rapid Material Characterisation - The PC software (included with the system) performs all the necessary measurements and calculations for sheet resistance, resistivity, and conductivity - making material characterisation effortless. It also automatically performs correction factor calculation.

Easily Repeat Experiments - The settings used for a measurement are saved along with the data, making it easy to look up the details of the experiment. Furthermore, these settings files can be loaded by the same software, speeding up repeat measurements and material characterisation. With less time required for repeat measurements, your research output can be significantly increased.

Four-Point Probe System labelled diagram

Measurement Specifications

Voltage range±100 μV to ±10 V
Current range±1 μA to ±150 mA
Sheet resistance range3 mΩ/□ to 10 MΩ/□ (ohms per square)
Measurement accuracy< ±4%
Measurement precision±0.5%

Physical Specifications

Probe Spacing1.27 mm
Rectangular Sample Size RangeLong Edge Minimum: 5 mm Short Edge Maximum: 60 mm
Circular Sample Size Range (Diameter)5 mm to 76.2 mm
Maximum Sample Thickness10 mm
Overall DimensionsWidth: 145 mm Height: 150 mm Depth: 240 mm
Four-point probe close up
  • Clean and intuitively-designed interface
  • Data saved to .csv file
  • Calculates resistivity and conductivity for samples with a known thickness
  • Automatic correction factor calculation
  • Save & load previously-used settings

An intuitive and user-friendly standalone PC program is used to control the four-point probe measurement, enabling rapid characterisation of materials without the need for the user to write any code themselves. This PC software calculates appropriate geometrical correction factors for the given sample geometry, ensuring accurate results. It can also calculate the resistivity and conductivity of the sample, if the thickness is provided, to allow for extensive electrical characterisation of materials.

Sheet Resistance Measurement Software
Sheet Resistance Measurement Software
Four-point probe measurement of an ITO substrate
Four-point probe measurement of a 100 nm ITO film (S111)

The software saves data to comma-separated value (.csv) files, facilitating importing the data into your preferred analysis software. The settings are also saved along with the data, so you won't have to worry about losing your lab diary when trying to remember the details of your experiments. Furthermore, these settings files can be loaded by the program, making it much simpler and faster to repeat an experiment or use the same/similar settings again.


Software Requirements

Operating SystemWindows Vista, 7, 8, or 10 (32-bit or 64-bit)
CPUDual Core 2 GHz
RAM2 GB
Available Hard Drive Space178 MB
Monitor Resolution1440 x 900
ConnectivityUSB 2.0, or Ethernet (requires DHCP)

Material Characterisation - Resistivity is an inherent characteristic of a material, and an important electrical property. It can be determined by measuring the sheet resistance of a thin film with a known thickness, making the four-point probe measurement a key technique for the electrical characterisation of materials.

Four-point probe sample stage

Thin-Film Solar Cells and LEDs - Thin-film devices (such as perovskite solar cells or organic LEDs) require thin conducting electrodes that transport electrical charge laterally to be extracted. Therefore, materials with low sheet resistances are required to reduce potential losses at this stage. This becomes even more important when attempting to scale up these devices, as the electrical charges will have to travel further along the electrodes before they can be extracted.

Please note, this system may not be suitable for silicon or other materials which naturally form insulating oxide layers. To measure such materials, the oxide layer needs to be penetrated by the probes, which may not be possible with the spring-loaded, round tipped probes utilised by this system.

The four-point probe is the most commonly-used piece of equipment for measuring the sheet resistance of a material. Sheet resistance is the resistivity of a material divided by its thickness, and represents the lateral resistance through a thin square of conducting/semiconducting material. This measurement uses four probes arrayed in a line, with equal spacing between each probe. A current is passed between the outer two probes, causing a reduction in voltage between the inner two probes. By measuring this change in voltage, the sheet resistance can then be calculated using the following equation:

Sheet resistance equation

Here, I is the applied current and ΔV is the decrease in voltage between the inner probes. The result of this equation must further be multiplied by a geometric correction factor based upon the shape, size, and thickness of the sample. This accounts for limitations to the possible current pathways through the sample, which affects the values that are measured.

Four-Point Probe schematic

A more in-depth explanation of the theory behind sheet resistance, geometric correction factors, and the four-point probe technique can be found in our Guide to Sheet Resistance Theory.


Frequently Asked Questions

What sample thicknesses are compatible with the system?

The Four-Point Probe System is specifically designed to enable the measurement of thin films in the nanometre range. For example, we have successfully measured 30 – 40 nm films of PH 1000 PEDOT:PSS and < 100 nm silver nanowire films on PET, without creating holes in the thin films. For a more in-depth explanation, please see our application note: Sheet Resistance Measurements of Thin Films.

Do I need my own source measure unit (sourcemeter)?

The system has a built-in Ossila Source Measure Unit (SMU), so you don’t need to already have one. If you wish to use your own SMU, the Probe Station includes a four-point probe head without a SMU. However, the Ossila Sheet Resistance software is only compatible with Ossila’s SMU, and cannot be used with others.

What resistivity/conductivity range can the system measure?

As the system measures the sheet resistance of a sample, a general range of measurable resistivities or conductivities cannot be given. This is because the measurable resistivity range depends on the thickness of the sample being tested. The resistivity of a sample can be calculated from its sheet resistance and thickness using the following equation:

Sheet resistance resistivity equation

The system is capable of measuring between 3 mΩ/□ and 10 MΩ/□, so if we use these values in the formula above with a sample 50 nm thick, then the resistivity (conductivity) range that can be measured by the system will be 0.5 nΩ.m to 500 mΩ.m (2 S/m to 2 GS/m). If the sample is 400 µm thick, then the resistivity (conductivity) range of the system is 4 µΩ.m to 4 kΩ.m (250 µS/m to 250 kS/m). Below is a table of the resistivity and conductivity ranges of the system for samples with thicknesses of different orders of magnitude:

Sample ThicknessResistivity RangeConductivity Range
10 nm30 pΩ.m - 100 mΩ.m10 S/m - 30 GS/m
100 nm300 pΩ.m - 1 Ω.m1 S/m - 3 GS/m
1 µm3 nΩ.m - 10 Ω.m100 mS/m - 300 MS/m
10 µm30 nΩ.m - 100 Ω.m10 mS/m - 30 MS/m
100 µm300 nΩ.m - 1 kΩ.m1 mS/m - 3 MS/m
1 mm3 µΩ.m - 10 kΩ.m100 µS/m - 300 kS/m

Do you offer other probe designs?

Currently we offer a single probe layout, i.e. linear with 1.27 mm spacing between the probes, 0.48 mm probe diameter, and 60 g spring pressure. This allows us to maintain the affordable price of the Four-Point Probe System, whilst still providing reliable and accurate measurements of sheet resistance.

Does the price include everything?

Yes, everything shown on the product page is included! The source-measure unit, four-point probe head, linear translation stage, software, even an ITO-coated glass substrate!


To the best of our knowledge the technical information provided here is accurate. However, Ossila assume no liability for the accuracy of this information. The values provided here are typical at the time of manufacture and may vary over time and from batch to batch.

About Ossila Founded in 2009 by organic electronics research scientists, Ossila aims to provide the components, equipment, and materials to enable intelligent and efficient scientific research and discovery. Over a decade on, we're proud to supply our products to over 1000 different institutions in over 80 countries globally. With decades of academic and industrial experience in developing organic and thin-film LEDs, photovoltaics, and FETs, we know how long it takes to establish a reliable and efficient device fabrication and testing process. As such, we have developed coherent packages of products and services - enabling researchers to jump-start their organic electronics development program. The Ossila Guarantee Free Worldwide Shipping Eligible orders ship free to anywhere in the world Fast Secure Dispatch Rapid dispatch on in-stock items via secure tracked courier services Quality Assured Backed up by our free two year warranty on all equipment Clear Upfront Pricing Clear pricing in over 30 currencies with no hidden costs Large Order Discounts Save 8% on orders over $10,300.00 and 10% on orders over $12,900.00 Expert Support Our in-house scientists and engineers are always ready to help Trusted Worldwide Great products and service. Have already recommended to many people. Dr. Gregory Welch, University of Calgary Wonderful company with reasonably priced products and so customer-friendly! Shahriar Anwar, Arizona State University The Ossila Team Prof. David Lidzey - Chairman As professor of physics at the University of Sheffield, Prof. David Lidzey heads the university’s Electronic and Photonic Molecular Materials research group (EPMM). During his career, David has worked in both academic and technical environments, with his main areas of research including hybrid organic-inorganic semiconductor materials and devices, organic photonic devices and structures and solution processed photovoltaic devices. Throughout his academic career, he has authored over 220 peer-reviewed papers. Dr. James Kingsley - Managing Director James is a co-founder and managing director of Ossila. With a PhD in quantum mechanics/nanotech and over 12 years’ experience in organic electronics, his work on the fabrication throughput of organic photovoltaics led to the formation of Ossila and the establishment of a strong guiding ethos: to speed up the pace of scientific discovery. James is particularly interested in developing innovative equipment and improving the accessibility of new materials for solution-processable photovoltaics and hybrid organic-inorganic devices. Dr. Alastair Buckley - Technical Director Alastair is a lecturer of Physics at the University of Sheffield, specialising in organic electronics and photonics. He is also a member of the EPMM research group with a focus on understanding and applying the intrinsic advantages of functional organic materials to a range of optoelectronic devices. Alastair’s experience has not been gained solely in academia; he previously led the R&D team at MicroEmissive Displays and therefore has extensive technical experience in OLED displays. He is also the editor and contributor of "Organic Light-Emitting Diodes" by Elsevier. Our Research Scientists Our research scientists and product developers have significant experience in the synthesis and processing of materials and the fabrication and testing of devices. The vision behind Ossila is to share this experience with academic and industrial researchers alike, and to make their research more efficient. By providing products and services that take the hard work out of the device fabrication process, and the equipment to enable accurate, rapid testing, we can free scientists to focus on what they do best - science. Customer Care Team The customer care team is responsible for the customer journey at Ossila. From creating and providing quotes, through to procurement and inventory management, the customer care team is devoted to providing first class customer service. The general day to day responsibilities of a customer care team member involves processing customers orders and price queries, answering customer enquiries, arranging the shipment of parcels and notifying customers of updates on their orders. Collaborations and Partnerships Please contact the customer care team for all enquires, including technical questions about Ossila products or for advice on fabrication and measurement processes. Location and Facilities Ossila is based at the Solpro Business Park in Attercliffe, Sheffield. We operate a purpose-built synthetic chemistry and device testing laboratory on site, where all of our high-purity, batch-specific polymers and other formulations are made. This is complemented by a dedicated suite of thin-film and organic electronics testing and analysis tools within the device fabrication cluster housed in a class 1000 cleanroom in the EPSRC National Epitaxy Facility in Sheffield. All our electronic equipment is manufactured on-site.